University of Delaware - Surface Analysis Facility USA

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[ Visit Site ] The Surface Analysis Facility at the University of Delaware's Department of
Chemistry & Biochemistry offers consulting and services in:

* X-ray Photoelectron Spectroscopy (XPS or ESCA)
* Time-of-Flight Secondary-Ion Mass Spectrometry (ToF-SIMS)
* X-ray Photoelectron Imaging
* Auger Electron Spectroscopy (AES)
* Scanning Auger Microscopy or Imaging (SAM)
* Secondary-Electron Microscopy (SEM)
* Ion-Scattering Spectroscopy (ISS or LEIS)
* Scanning Probe Microscopy (STM and AFM)

To help defray operating costs, the Facility also welcomes, and the NSF encourages, collaborative interactions with other universities and colleges, as well as local, regional and national for-profit companies. The Facility charges a fee for services in accordance with NSF guidelines and University policies.

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